HOLBROOK, NY, - February, 2006 – Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces a new X-ray fluorescence coating thickness and composition measurement tool called the HiSpex. The HiSpeX is designed to measure thin metal film deposition thickness and compositions along with the determination of elemental composition of solids. The HiSpeX is an excellent choice for coating applications where films below 1000 angstroms (4 µin.) are employed and/or binary and ternary alloy stacks are required and where complex alloy coatings and/or base materials need to be determined. Key Features of the HiSpex include Measurement of extremely thin coatings, Measurement of complex alloys, especially where peak element overlap exists and excellent sensitivity and electrical stability for thin coatings and complex alloys.

The HiSpex utilizes an electrically cooled Silicon Pin-Diode detector coupled with superior digital signal pulse processing. The result is a significant improvement in detection resolution, excellent multi-channel analyzer stability and production-friendly solid state detector performance.

The HiSpeX is an excellent choice for typical Microwave and RF device applications including Ni, Ni-P, Ag, Au, Sn and Sn-Pb. In addition, the HiSpex allows for material sorting and can measure any typical connector easily and efficiently.

Matrix Metrologies headquartered in Holbrook, New York offers over twenty five years experience in metrology analysis, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable calibration standards and recertification services.

Additional information on Matrix can be found at http://www.matrixmetrologies.com