HOLBROOK, NY, - December, 2005 – Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces the INVOeco, a low cost universal X-ray analysis system designed for coating thickness and material analysis measurement of fasteners and Connectors. The INVOeco offers full XRF capability at a very reasonable price/ performance ratio. The economical “bottom to top” X-ray excitation allows for fast and easy sample positioning

The INVOeco is very well suited for the analysis of flat and bulk samples, like fasteners, connectors , pins,contacts, small PCB's and metal parts of all kinds. In addition, liquids and powders, placed in a sample container, can be analysed as well. The INVOeco is ideal for metal film thickness and composition measurement where simplicity of operation and accuracy, repeatability and reproducibility are demanded.

The INVOeco utilizes an efficient beam-to-sample and sample-to detector path solution that results in extremely fast measuring times and the tool can be configured with a standard gas proportional detector or an electrically cooled Silicon Pin-Diode detector with digital signal pulse processing. System architecture is coupled with a new enhanced Fundamental Parameters Windows XP based software platform ensures consistent results in multiple user and application environments. A comprehensive library of simple to use automated software tools is available, for coating measurement and bulk and liquid sample elemental concentration determination.

INVOeco is part of Matrix Metrologies complete family of x-ray fluorescence thickness and composition measurement tools.

Matrix Metrologies, headquartered in Holbrook, New York offers over twenty five years experience in metrology analysis, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable calibration standards and recertification services.