Matrix Metrologies Introduces New XRF Tool the Compact 5
HOLBROOK, NY, - March, 2005 – Matrix Metrologies,
Inc., a supplier of film measurement equipment, introduces the new Compact 5 X-ray fluorescence coating thickness measurement systems. The compact family
of XRF products is comprised of systems designed exclusively for the metal film measurement needs of the fastener, connector
and metal finishing industries. The Compact 5 features micro-beam mechanical collimation and a precise motorized stage coupled
with a processed signal detection column that delivers superior stability and reproducibility in harsh plant environments.
The Compact Eco is a lower cost alternative utilizing larger beams for less demanding applications. Both tools support Sophisticated
Fundamental Parameters measurement Algorithms and a simple to use Windows XP based graphical user interface to ensure consistent
results in multiple user and application environments. The Compact 5 and the
Compact Eco are ideal for metal film thickness and composition measurement on fasteners and connectors. Both tools are network
compatible and the 5 Series can be programmed for automated measurements with the point and shoot graphic assisted motorized
programmable stage.
The Compact 5 and Compact Eco are part of Matrix Metrologies complete family of x-ray fluorescence
thickness and composition measurement tools and Matrix can supply Brochures for both products electronically.
Matrix Metrologies, headquartered in Holbrook, New York offers over twenty five years experience in metrology analysis, XRF instrumentation recertification
and repair and supplies a complete line of NIST traceable calibration standards and recertification services.
Additional information on Matrix can be found at http://www.matrixmetrologies.com.
