HiSpeX technology provides enhanced measurement capability by
utilizing an electrically cooled Silicon Pin-Diode detector coupled with superior digital signal pulse processing. The result
is a significant improvement in detection resolution, excellent multi-channel analyzer stability and production-friendly solid
state detector performance.
XRF is an excellent choice
since it has a broad analysis range. Element concentrations can be measured from
ppm levels to 100%.
For more detailed product information or to schedule
a product demonstration, e-mail us at:
|
 |
|
|
Key Features:
Measurement of extremely thin coatings.
Measurement of complex alloys, especially where peak element overlap exists.
Excellent sensitivity and electrical stability.
|
|
|
|
|
The EU RoHS
directive has established a deadline
(July 1, 2006) for the development, implementation and verification of Pb-free materials and finishes for electrical and electronic
equipment. For finishers supplying product to be used in commercial electronics, this necessitates lead content verification
at Pb-free levels (RoHS action level of 0.1%, 1000 ppm. For finishers supplying
product to exempted applications, i.e., military and aerospace, lead content verification at normal Pb-eutectic levels will
be demanded.
|
|
|
|
|
