A versatile portable X-ray coating thickness measurement and material analysis system designed for the inspection of metal finished parts and electronic components, the New HMX allows the user to take the Lab to the process by delivering the speed, power and precision of XRF analysis, wherever and whenever it is needed.

 

HMX is your choice when coating thickness measurement and material analysis applications demand at-process measurement for QC, plating line, and analysis lab applications and at-sample analysis in the factory or in the field.

In addition the unique HMX “Batch Measurement” mode lets you calculate the average thickness of a batch of small parts with a single measurement. Simply “point and shoot” and the analyzer automatically generates an average thickness for the entire lot.

 

The HMX is an XRF solution for measurement of large (even giant) samples